ST830E OCT Imaging Spectrometer CE With Customized Wavelength Range

Engineered specifically for OCT implementations, the ST830E/ST850E spectrometer family plays a pivotal role in spectral domain systems. These instruments establish fundamental parameters that govern OCT performance metrics, particularly affecting imaging velocity and signal integrity throughout the detection range.

Our ST830/850E spectrometers feature a proprietary optical design that physically implements wavenumber-linear dispersion, allowing direct equal-spaced sampling without software interpolation. This hardware-based approach simplifies signal processing by enabling immediate FFT conversion while boosting SNR performance. The integration of volume phase holographic grating technology ensures high diffraction efficiency, achieving 110dB sensitivity in SD-OCT configurations (7mW, 120kHz) for exceptional in vivo imaging results.

• Deep Imaging: Excellent roll-off performance enables imaging at deeper layers.
• Wavenumber Linearity: Special optical path design allows for equidistant wavenumber sampling on the hardware. Direct FFT (Fast Fourier Transform) is possible, significantly reducing data processing complexity.
• Fast Processing: The USB3.0 interface allows for a scanning speed of 20-130kHz, making OEM processes more efficient and straightforward.
• High Signal-to-Noise Ratio, High Resolution: Efficient VPH grating, optical resolution approaching the diffraction limit.

• Industrial OCT Systems: Metal cutting and welding, Laser oscillation etc.
• Medical OCT Systems: Vascular imaging, Anterior chamber of eye etc.
• Other OCT Systems: Detection of uniformity in multilayer coatings etc.